Memory corruption in Automotive due to improper input validation.
Initial xbl_sec revision does not have all the debug policy features and critical checks.
Memory corruption in WLAN HAL while arbitrary value is passed in WMI UTF command payload.
Memory corruption in display due to double free while allocating frame buffer memory
Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables
Memory corruption in graphics due to buffer overflow while validating the user address in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Memory corruption in MODEM UIM due to usage of out of range pointer offset while decoding command from card in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Memory corruption in multimedia due to use after free during callback registration failure in Snapdragon Mobile
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing.
Memory Corruption when processing auxiliary sensor input/output control commands with insufficient buffer size validation.
Use after free in graphics fence due to a race condition while closing fence file descriptor and destroy graphics timeline simultaneously in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
kernel event may contain unexpected content which is not generated by NPU software in asynchronous execution mode in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Memory corruption while processing input message passed from FE driver.
Memory corruption may occur while attaching VM when the HLOS retains access to VM.
Memory corruption in audio due to use after free while managing buffers from internal cache in Snapdragon Compute, Snapdragon Connectivity, Snapdragon Mobile
Memory corruption while processing the IOCTL FM HCI WRITE request.
Memory corruption in TZ Secure OS while Tunnel Invoke Manager initialization.
Memory corruption while reading ACPI config through the user mode app.
Memory corruption while invoking HGSL IOCTL context create.
Memory corruption in HLOS while checking for the storage type.
Memory corruption while invoking the SubmitCommands call on Gfx engine during the graphics render.
Memory corruption while processing the event ring, the context read pointer is untrusted to HLOS and when it is passed with arbitrary values, may point to address in the middle of ring element.
Possible out of bound write due to improper validation of number of timer values received from firmware while syncing timers in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking
Memory corruption when more scan frequency list or channels are sent from the user space.
Improper buffer initialization on the backend driver can lead to buffer overflow in Snapdragon Auto
Memory corruption may occur while accessing a variable during extended back to back tests.
Memory corruption when multiple listeners are being registered with the same file descriptor.
Out of bound access can happen in MHI command process due to lack of check of command channel id value received from MHI devices in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables in APQ8009, Kamorta, MDM9607, MSM8917, MSM8953, Nicobar, QCM2150, QCS405, QCS605, QM215, Rennell, SA6155P, SA8155P, Saipan, SC8180X, SDM429, SDM429W, SDM439, SDM450, SDM632, SDM710, SDM845, SDX55, SM6150, SM7150, SM8150, SM8250, SXR2130
Improper validation of data length received from DMA buffer can lead to memory corruption. in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wired Infrastructure and Networking
Improper handling of multiple session supported by PVM backend can lead to use after free in Snapdragon Auto, Snapdragon Mobile
Possible out of bounds read due to improper typecasting while handling page fault for global memory in Snapdragon Connectivity, Snapdragon Mobile
Possible null pointer dereference due to lack of WDOG structure validation during registration in Snapdragon Auto, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile
Non-secure region can try modifying RG permissions of IO space xPUs due to improper input validation in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Possible buffer overflow due to lack of validation for the length of NAI string read from EFS in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Mobile
Out of bound write in DSP service due to improper bound check for response buffer size in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
A user with user level permission can access graphics protected region due to improper access control in register configuration in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Possible buffer overflow due to lack of input IB amount validation while processing the user command in Snapdragon Auto
Possible integer overflow due to improper fragment datatype while calculating number of fragments in a request message in Snapdragon Auto, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile
Possible out of bounds access due to improper input validation during graphics profiling in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Possible use after free scenario in compute offloads to DSP while multiple calls spawn a dynamic process in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile
Memory corruption in BT controller due to improper length check while processing vendor specific commands in Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer Electronics Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wired Infrastructure and Networking
Possible out of bound read due to improper length calculation of WMI message. in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Memory corruption in DSP service due to improper validation of input parameters in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile
Possible buffer overflow due to improper validation of array index while processing external DIAG command in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
Improper verification of timeout-based authentication in identity credential can lead to invalid authorization in HLOS in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile
Memory corruption in Audio while processing the calibration data returned from ACDB loader.
Memory corruption during concurrent buffer access due to modification of the reference count.
Memory corruption may occur during IO configuration processing when the IO port count is invalid.
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Memory corruption due to improper bounds check while command handling in camera-kernel driver.