Memory corruption while processing simultaneous requests via escape path.
Memory corruption while processing IOCTL command with larger buffer in Bluetooth Host.
Transient DOS while processing CCCH data when NW sends data with invalid length.
Memory corruption while processing commands from A2dp sink command queue.
Memory corruption while processing IOCTL command when multiple threads are called to map/unmap buffer concurrently.
Transient DOS while processing a random-access response (RAR) with an invalid PDU length on LTE network.
Memory corruption whhile handling the subsystem failure memory during the parsing of video packets received from the video firmware.
Transient DOS while handling beacon frames with invalid IE header length.
Memory corruption during the image encoding process.
Memory corruption while processing data packets in diag received from Unix clients.
Memory corruption while processing event close when client process terminates abruptly.
Memory corruption while processing the TESTPATTERNCONFIG escape path.
Memory corruption while processing multiple simultaneous escape calls.
Memory corruption while processing manipulated payload in video firmware.
Memory corruption while processing video packets received from video firmware.
Memory corruption while processing a private escape command in an event trigger.
Transient DOS while processing received beacon frame.
Cryptographic issue occurs due to use of insecure connection method while downloading.
Transient DOS may occur while processing malformed length field in SSID IEs.
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
Transient DOS when importing a PKCS#8-encoded RSA private key with a zero-sized modulus.
Memory corruption while retrieving the CBOR data from TA.
Information disclosure while decoding this RTP packet Payload when UE receives the RTP packet from the network.
Cryptographic issue while processing crypto API calls, missing checks may lead to corrupted key usage or IV reuses.
Memory corruption while operating the mailbox in Automotive.
memory corruption while processing IOCTL commands, when the buffer in write loopback mode is accessed after being freed.
Memory corruption may occur while processing voice call registration with user.
Memory corruption while processing escape code, when DisplayId is passed with large unsigned value.
Memory corruption while processing image encoding, when configuration is NULL in IOCTL parameter.
Memory corruption while processing image encoding, when input buffer length is 0 in IOCTL call.
Memory corruption while reading response from FW, when buffer size is changed by FW while driver is using this size to write null character at the end of buffer.
Memory corruption while reading the FW response from the shared queue.
Transient DOS while parsing per STA profile in ML IE.
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.
Memory corruption during the FRS UDS generation process.
Memory corruption while triggering commands in the PlayReady Trusted application.
Memory corruption during memory mapping into protected VM address space due to incorrect API restrictions.
Memory corruption during memory assignment to headless peripheral VM due to incorrect error code handling.
Memory corruption while reading secure file.
Memory corruption may occur during IO configuration processing when the IO port count is invalid.
Memory corruption during concurrent access to server info object due to incorrect reference count update.
Memory corruption during concurrent access to server info object due to unprotected critical field.
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.
Memory corruption occurs when handling client calls to EnableTestMode through an Escape call.
Memory corruption while processing escape code in API.
Memory corruption occurs during the copying of read data from the EEPROM because the IO configuration is exposed as shared memory.
Memory corruption while calling the NPU driver APIs concurrently.
Transient DOS may occur while processing the country IE.
Memory corruption in display driver while detaching a device.